Academy for Radiation Effects and Survivability (A4RES)
June 2 - June 6, 2025
Hosted by Indiana University Center for Reliable and Trusted Electronics in Bloomington, IN
Dorsey Learning Hall located within Luddy Hall
SEE Test Part 1
Radiation from the natural space environment affects electronic circuit operation by resulting in random spurious perturbations in integrated circuit (IC) functionality and performance degradation over time. Single-Event Effects (SEE) are one such class of responses caused by a single, energetic particle striking a device, leading to transient phenomena or bit flips in memory cells. Testing for these effects is critical to ensure proper operation in space, requiring specialized facilities for exposing electronics to controlled radiation. This interactive course guides students in planning, coordinating, and ensuring better use of accelerated ground-based radiation facilities for successful Single-Event Effects characterization tests.
Students will be assessed via homework, quizzes, and interactive exercises on common non-beam artifacts such as Test Plans and Test Readiness Reviews.
The intended audience is practitioners who are performing SEE testing for the DoD; some testing experience is suggested.