
Reliable Electronics and Systems (RES) Lab
PI: Daniel Loveless
Radiation-hardened electronics from devices to the circuit level
- Process modeling with radiation effects
- Test chip design
- Radiation-aware compact modeling
- Radiation-hardened-by-design systems design & training
- Radiation testing & training
- Software tool development & automation: commercial off-the-shelf (COTS) tools and in-house-developed software
- Applied machine learning and artificial intelligence
- Basic and applied research grants; SBIR/STTR; and CRADA agreements (Cooperative Research and Development Agreement)
Systems Assurance and Integrity Lab (SAIL-IN)
PI: Andrew Lukefahr
Hardware systems security, and Field-Programable Gate Array (FPGA) designs for security.
- Discovering security vulnerabilities, especially in commercial FPGAs
- Design of active defense mechanisms against known security vulnerabilities within commercial FPGAs
- Red-Team analysis of hardware security mechanisms
- Designed FPGAs architectures for high radiation environments, with and without security features.
Harsh-Environemnt Reliability of Microelectronics and Emerging Semiconductors (HERMES)
PI: Adrian IldefonsoDeveloping testing and hardening techniques by combining experiments and multi-scale modeling.
- Pulsed-laser single-event effects (SEE) testing and correlation with heavy-ion response
- AI/ML-driven analysis of reliability and radiation-induced failure mechanisms
- TCAD and physics-based simulations for harsh environment reliability
- Integrated photonics for robust space communication and sensing
Radiation Testing
On-Site
- 14 MeV Low-Energy-Neutron-Source (LENS)
Off-Site
- ARACOR 10 keV X-ray
- Brookhaven National Laboratory Tandem Van de Graaff
- Lawrence Berkeley Laboratory 88” Cyclotron
- Michigan State University Facility for Rare Isotopes Beam (FRIB)
- NASA Space Radiation Laboratory (NSRL) at Brookhaven
- Tri-University Meson Factory (TRIUMF)
- NAVSEA-Crane suite of radiation sources and failure analysis (FA) laboratory
Major Equipment
- Form Factor PAC200 Cryogenic Wafer Probe Station
- Teradyne UltraFlexPlus Q6
- Keithley 4200A Parameter Analyzer
- Tektronix MSO Real-Time Oscilloscope (16 GS/s)
- Keysight Power Supplies
- Keithley 2636B Source-Measure-Units
