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Daniel Loveless Publications

2025

J. H. Tyler, D. Reising, M. M. K. Fadul, T. D. Loveless, and M. Sartipi, “Simplifying Multi-Domain Specific Emitter Identification,” Oct. 22, 2025, Preprints. doi: 10.36227/techrxiv.176115911.13495343/v1.
T. Peyton and T. D. Loveless, “Single Event Upset Effects on Deep Neural Networks: A Model and Dataset-Level Perspective,” presented at the 2025 RADiation and its Effects on Components and Systems Conference (RADECS), Antwerp, Belgium, Oct. 2025.
D. Fleetwood et al., “Comments by the Editors,” IEEE Trans. Nucl. Sci., vol. 72, no. 8, pp. 2261–2261, 2025, doi: 10.1109/TNS.2025.3592047.
D. Fleetwood et al., “IEEE: Special NSREC 2024 Issue of the IEEE Transactions on Nuclear Science Editor Comments,” IEEE Trans. Nucl. Sci., vol. 72, p. 969, 2025.
J. Ermi et al., “Effects of Total Ionizing Dose on Specific Emitter Identification and Authentication of Software-Defined Radios,” IEEE Transactions on Nuclear Science, 2025.
J. L. Carpenter et al., “A Radiation-Hardened-by-Design Wide-Band Operational Amplifier Fabricated in the SkyWater S90LN 90 nm Process,” Journal of Radiation Effects Research and Engineering (JRERE), 2025.
S. Westfall et al., “Built-In Self-Test Measurement of Radiation Effects in the SkyWater S90LN 90 nm Process,” Journal of Radiation Effects Research and Engineering (JRERE), 2025.
J. L. Carpenter et al., “A Hierarchical Framework for Classifying Analog Single-Event Transients by Shape,” IEEE Trans. Nucl. Sci., pp. 1–1, 2025, doi: 10.1109/TNS.2025.3622955.
D. Fleetwood et al., “IEEE: Special NSREC 2024 Issue of the IEEE Transactions on Nuclear Science Editor Comments,” IEEE Trans. Nucl. Sci., vol. 72, p. 969, 2025.

2024

J. H. Tyler, M. K. Fadul, M. R. Hilling, D. R. Reising, and T. D. Loveless, “Discover Internet of Things,” 2024.
S. Westfall et al., “Built-In Self-Test Measurement of Single Event Transients in the Skywater S90ln 90 Nm Process,” in 2024 RADECS Data Workshop, IEEE, 2024, pp. 1–6.
S. Westfall et al., “Built-In Self-Test Measurement of Single Event Transients in the Skywater S90ln 90 Nm Process,” in 2024 RADECS Data Workshop, IEEE, 2024, pp. 1–6.
J. H. Tyler, M. K. Fadul, M. R. Hilling, D. R. Reising, and T. D. Loveless, “Discover Internet of Things,” 2024.
M. A. Taha, M. M. Fadul, J. H. Tyler, D. R. Reising, and T. D. Loveless, “Enhancing internet of things security using entropy-informed RF-DNA fingerprint learning from Gabor-based images,” EURASIP Journal on Information Security, vol. 2024, no. 1, p. 27, 2024.
D. R. Reising, J. H. Tyler, M. K. Fadul, M. R. Hilling, and T. D. Loveless, “Improved rf fingerprint-based identity verification in the presence of an sei mimicking adversary,” Journal of Cyber Security and Mobility, vol. 13, no. 5, pp. 887–916, 2024.
T. Peyton, J. Carpenter, D. Reising, and D. Loveless, “Classification of Microelectronics Radiation Effects Using Unsupervised Machine Learning,” in 2024 IEEE Aerospace Conference, IEEE, 2024, pp. 1–9.
J. Kim et al., “On-chip characterization of random telegraph signal noise in bulk 90 nm cmos,” in 2024 IEEE International Reliability Physics Symposium (IRPS), IEEE, 2024, pp. 1–6.
D. Fleetwood et al., “Special NSREC 2023 Issue of the IEEE Transactions on Nuclear Science Editor Comments,” IEEE Transactions on Nuclear Science, vol. 71, no. 4, pp. 367–367, 2024.
D. Fleetwood and K. Avery, “Editorial Conference Summary by the General Chair,” IEEE Transactions on Nuclear Science, vol. 71, no. 4, pp. 364–366, 2024.
M. K. Fadul, D. R. Reising, L. P. Weerasena, T. D. Loveless, M. Sartipi, and J. H. Tyler, “Improving RF-DNA fingerprinting performance in an indoor multipath environment using semi-supervised learning,” IEEE Transactions on Information Forensics and Security, vol. 19, pp. 3194–3209, 2024.
J. Carpenter et al., “Heavy-Ion SET and SEL Response of a Wide-Band Operational Amplifier Fabricated in the Sky Water S90LN 90 nm Process,” in 2024 IEEE Radiation Effects Data Workshop (REDW)(in conjunction with 2024 NSREC), IEEE, 2024, pp. 1–6.

2023

J. H. Tyler, M. K. Fadul, M. R. Hilling, D. R. Reising, and T. D. Loveless, “Assessing adversarial replay and deep learning-driven attacks on specific emitter identification-based security approaches,” arXiv preprint arXiv:2308.03579, 2023.
D. R. Reising, J. H. Tyler, M. K. Fadul, M. R. Hilling, and T. D. Loveless, “RF fingerprint-based identity verification in the presence of an SEI mimicking adversary,” in 2023 19th International Conference on Wireless and Mobile Computing, Networking and Communications (WiMob), IEEE, 2023, pp. 438–444.
C. S. Peggs et al., “Preamble-based RF-DNA Fingerprinting Under Varying Temperatures,” in 2023 12th Mediterranean Conference on Embedded Computing (MECO), IEEE, 2023, pp. 1–8.
T. Peyton et al., “Supervised deep learning and classification of single-event transients,” IEEE Transactions on Nuclear Science, vol. 70, no. 8, pp. 1740–1746, 2023.
A. A. Mohammed, M. A. Taha, J. H. Tyler, M. K. Fadul, D. R. Reising, and T. D. Loveless, “CNN-based Emitter ID-Verification and Rogue Emitter Rejection for IoT Networks using Entropy-Informed RF-DNA Fingerprints,” in MILCOM 2023-2023 IEEE Military Communications Conference (MILCOM), IEEE, 2023, pp. 377–384.
J. Neuendank et al., “TID Effects on Random Telegraph Signals in Bulk 90 nm MOSFET Devices,” in 2023 IEEE International Integrated Reliability Workshop (IIRW), IEEE, 2023, pp. 1–5.
S. Lawrence and D. Loveless, “System-level radiation effects modeling using temporal fault trees,” in 2023 IEEE Aerospace Conference, IEEE, 2023, pp. 1–14.
S. Lawrence, “Probabilistic risk assessment of system-level radiation effects,” 2023.
D. Fleetwood et al., “IEEE: Comments by the Editors,” IEEE Trans. Nucl. Sci., vol. 70, p. 1529, 2023.
D. Fleetwood et al., “Special NSREC 2022 Issue of the IEEE Transactions on Nuclear Science Editor Comments,” IEEE Transactions on Nuclear Science, vol. 70, no. 4, pp. 300–300, 2023.
J. Carpenter et al., “Analysis of single event transients in arbitrary waveforms using statistical window analysis,” IEEE Transactions on Nuclear Science, vol. 70, no. 4, pp. 478–485, 2023.

2022

M. A. Taha, M. K. Fadul, J. H. Tyler, D. R. Reising, and T. D. Loveless, “An assessment of entropy-based data reduction for SEI within IoT applications,” in MILCOM 2022-2022 IEEE Military Communications Conference (MILCOM), IEEE, 2022, pp. 385–392.
S. McClure, “Conference Comments by the General Chair,” IEEE Transactions on Nuclear Science, vol. 69, no. 3, pp. 196–198, 2022.
S. Lawrence, S. Smith, J. Cannon, J. Carpenter, D. Reising, and T. Loveless, “Effects of total ionizing dose on SRAM physical unclonable functions,” IEEE Transactions on Nuclear Science, vol. 69, no. 3, pp. 349–358, 2022.
D. Fleetwood et al., “Special NSREC 2021 Issue of the IEEE Transactions on Nuclear Science Editor Comments,” IEEE Transactions on Nuclear Science, vol. 69, no. 3, pp. 199–199, 2022.
M. K. Fadul, J. T. Willis, D. R. Reising, and T. D. Loveless, “An analysis of process parameters for the optimization of specific emitter identification under Rayleigh fading,” in Global IoT Summit, Springer International Publishing Cham, 2022, pp. 277–291.
B. Dean et al., “Machine Learning Approaches for Analysis of Total Ionizing Dose in Microelectronics,” in 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS), IEEE, 2022, pp. 1–7.

2021

T. D. Loveless, “Fundamental Research Into Radiation Effects in Cryogenic Electronics Technologies,” 2021.
T. Loveless, D. Reising, J. Cancelleri, L. Massengill, and D. McMorrow, “Analysis of single-event transients (SETs) using machine learning (ML) and ionizing radiation effects spectroscopy (IRES),” IEEE Transactions on Nuclear Science, vol. 68, no. 8, pp. 1600–1606, 2021.
T. D. Loveless, “Fundamental Research Into Radiation Effects in Cryogenic Electronics Technologies,” 2021.
D. Fleetwood et al., “Special NSREC 2020 Issue of the IEEE Transactions on Nuclear Science Editor Comments,” IEEE transactions on nuclear science, vol. 68, no. 5, pp. 492–492, 2021.
M. Fadul, D. Reising, T. D. Loveless, and A. Ofoli, “Nelder-mead simplex channel estimation for the RF-DNA fingerprinting of OFDM transmitters under Rayleigh fading conditions,” IEEE Transactions on Information Forensics and Security, vol. 16, pp. 2381–2396, 2021.
J. M. Cannon et al., “Electrical measurement of cell-to-cell variation of critical charge in SRAM and sensitivity to single-event upsets by low-energy protons,” IEEE Transactions on Nuclear Science, vol. 68, no. 5, pp. 815–822, 2021.

2020

A. J. Wilson, D. R. Reising, R. W. Hay, R. C. Johnson, A. A. Karrar, and T. D. Loveless, “Automated identification of electrical disturbance waveforms within an operational smart power grid,” IEEE Transactions on Smart Grid, vol. 11, no. 5, pp. 4380–4389, 2020.
E. W. Richards, T. Loveless, J. Kauppila, T. Haeffner, W. Holman, and L. Massengill, “Radiation hardened by design subsampling phase-locked loop techniques in PD-SOI,” IEEE Transactions on Nuclear Science, vol. 67, no. 6, pp. 1144–1151, 2020.
D. Reising, J. Cancelleri, T. D. Loveless, F. Kandah, and A. Skjellum, “Radio identity verification-based IoT security using RF-DNA fingerprints and SVM,” IEEE Internet of Things Journal, vol. 8, no. 10, pp. 8356–8371, 2020.
W. Mitchell, K. Hall, D. Reising, T. Loveless, and others, “Phase-Modulated Local Oscillator Effects on RF-DNA Fingerprints in IEEE 802.11 a Wi-Fi Signals,” Bulletin of the American Physical Society, vol. 65, 2020.
A. Ibrahim, “The manipulation of RF-DNA fingerprints through the use of a phase-modulated clock in IEEE802. 11a Wi-Fi signals,” 2020.

2019

E. W. Richards, J. S. Kauppila, T. D. Haeffner, W. T. Holman, L. W. Massengill, and T. D. Loveless, “RHBD Techniques for a Sub-Sampling Phase-Locked Loop in 32nm PD-SOI,” 2019.
A. J. Wilson, D. R. Reising, and T. D. Loveless, “Integration of matched filtering within the RF-DNA fingerprinting process,” in 2019 IEEE Global Communications Conference (GLOBECOM), IEEE, 2019, pp. 1–6.
E. W. Richards, J. S. Kauppila, T. D. Haeffner, W. T. Holman, L. W. Massengill, and T. D. Loveless, “RHBD Techniques for a Sub-Sampling Phase-Locked Loop in 32nm PD-SOI,” 2019.
B. Patel, “Ionizing radiation effects spectroscopy,” 2019.
T. Loveless et al., “Ionizing radiation effects spectroscopy for analysis of single-event transients,” IEEE Transactions on Nuclear Science, vol. 67, no. 1, pp. 99–107, 2019.
M. K. Fadul, D. R. Reising, T. D. Loveless, and A. R. Ofoli, “RF-DNA fingerprint classification of OFDM signals using a Rayleigh fading channel model,” in 2019 IEEE Wireless Communications and Networking Conference (WCNC), IEEE, 2019, pp. 1–7.
R. C. Boggs, E. Richards, L. W. Massengill, and T. D. Loveless, “An electro-optical simulation methodology for the analysis of single-event radiation effects in photonic devices,” in 2019 SoutheastCon, IEEE, 2019, pp. 1–5.

2018

B. Patel et al., “Ionizing radiation effects spectroscopy for analysis of total-ionizing dose degradation in RF circuits,” IEEE Transactions on Nuclear Science, vol. 66, no. 1, pp. 61–68, 2018.
T. Loveless, “Space Systems Engineering in Undergraduate Education,” in Proceedings of the ASEE Southeastern Section Annual Conference 2018, 2018.
M. P. King et al., “TID-Induced Leakage and Drive Characteristics of Planar 22-nm PDSOI and 14-nm Bulk and Quasi-SOI FinFET Devices.,” Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2018.
M. Joplin, “A method for characterization of single-event latchup technologies as a function of geometric variation,” 2018.
L. Ding et al., “Modeling the impact of well contacts on SEE response with bias-dependent Single-Event compact model,” Microelectronics Reliability, vol. 81, pp. 337–341, 2018.
L. Ding et al., “Circuit-level Prediction of Charge Sharing Transients and Upsets for Various Well Contacts,” in 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS), IEEE, 2018, pp. 1–5.

2017

V. Pouget, “2016 IEEE Nuclear and Space Radiation Effects Conference Awards Comments by the Chairman,” IEEE Transactions on Nuclear Science, vol. 64, no. 1, pp. 13–14, 2017.
T. D. Loveless, “CMOS Phase-Locked Loops,” in Extreme Environment Electronics, CRC Press, 2017, pp. 601–618.
R. Harrington et al., “Estimating single-event logic cross sections in advanced technologies,” IEEE Transactions on Nuclear Science, vol. 64, no. 8, pp. 2115–2121, 2017.
N. J. Gaspard III, Single-event upset technology scaling trends of unhardened and hardened flip-flops in bulk CMOS. Vanderbilt University, 2017.
Y. Chen et al., “Time-domain modeling of all-digital PLLs to single-event upset perturbations,” IEEE Transactions on Nuclear Science, vol. 65, no. 1, pp. 311–317, 2017.
J. D. Cressler and H. A. Mantooth, Extreme environment electronics. CRC Press, 2017.
Y. Chen, L. Massengill, J. Kauppila, B. Bhuva, W. Holman, and T. Loveless, “Single-Event Upset Characterization of Common First-and Second-Order All-Digital Phase-Locked Loops,” IEEE Transactions on Nuclear Science, vol. 64, no. 8, pp. 2144–2151, 2017.

2016

T. D. Loveless and W. T. Holman, “Single-event mitigation techniques for analog and mixed-signal circuits,” in Ionizing Radiation Effects in Electronics: From Memories to Imagers, M. Bagatin and S. Gerardin, Eds., CRC Press, 2016, pp. 229–264.
T. Loveless et al., “Combined effects of total ionizing dose and temperature on a k-band quadrature LC-tank VCO in a 32 nm CMOS SOI technology,” IEEE Transactions on Nuclear Science, vol. 64, no. 1, pp. 204–211, 2016.
J. Kauppila et al., “14/16 nm FinFET radiation response characterization,” in Proc. Government Microcircuit Appl. Critical Technol. Conf., 2016, pp. 307–310.
S. Jagannathan, N. Mahatme, N. Gaspard, T. Loveless, B. Bhuva, and L. Massengill, “Hardware based empirical model for predicting logic soft error cross-section,” in 2016 IEEE International Reliability Physics Symposium (IRPS), IEEE, 2016, pp. 3B – 3.
Y. Chen et al., “Persistent laser-induced leakage in a 20 nm charge-pump phase-locked loop (PLL),” IEEE Transactions on Nuclear Science, vol. 64, no. 1, pp. 512–518, 2016.

2015

K. Shetler et al., “Radiation Hardening of Voltage References Using Chopper Stabilization,” 2015.
R. Quinn et al., “Heavy ion SEU test data for 32nm SOI flip-flops,” in 2015 IEEE Radiation Effects Data Workshop (REDW), IEEE, 2015, pp. 1–5.
D. L. McPherson, A. R. Ofoli, and T. D. Loveless, “BasketBallBot: Developing an intelligent controls teaching platform using LabView, MATLAB, and Arduino,” in SoutheastCon 2015, IEEE, 2015, pp. 1–8.
J. A. Maharrey et al., “Heavy-ion induced sets in 32nm soi inverter chains,” in 2015 IEEE Radiation Effects Data Workshop (REDW), IEEE, 2015, pp. 1–5.
J. S. Kauppila et al., “Geometry-aware single-event enabled compact models for sub-50 nm partially depleted silicon-on-insulator technologies,” IEEE Transactions on Nuclear Science, vol. 62, no. 4, pp. 1589–1598, 2015.
Y. Chen et al., “Single-event characterization of bang-bang all-digital phase-locked loops (ADPLLs),” IEEE Transactions on Nuclear Science, vol. 62, no. 6, pp. 2650–2656, 2015.

2014

R. C. Quinn, “Characterization of single event upsets in 32 nm SOI technology using alpha particle and heavy-ion radiation sources,” PhD Thesis, 2014.
N. Mahatme et al., “Kernel-based circuit partition approach to mitigate combinational logic soft errors,” IEEE Transactions on Nuclear Science, vol. 61, no. 6, pp. 3274–3281, 2014.
N. Mahatme et al., “Impact of technology scaling on the combinational logic soft error rate,” in 2014 IEEE international reliability physics symposium, IEEE, 2014, pp. 5F–2.
J. A. Maharrey, “Characterization of heavy-ion induced single event transients in 32nm and 45nm silicon-on-insulator technologies,” PhD Thesis, 2014.
J. Kauppila et al., “Utilizing device stacking for area efficient hardened SOI flip-flop designs,” in 2014 IEEE International Reliability Physics Symposium, IEEE, 2014, p. SE-4.
T. Haeffner et al., “Irradiation and temperature effects for a 32 nm RF silicon-on-insulator CMOS process,” IEEE Transactions on Nuclear Science, vol. 61, no. 6, pp. 3037–3042, 2014.
N. Gaspard et al., “Soft error rate comparison of various hardened and non-hardened flip-flops at 28-nm node,” in 2014 IEEE International Reliability Physics Symposium, IEEE, 2014, p. SE-5.
Y. Chen et al., “Single-event transient induced harmonic errors in digitally controlled ring oscillators,” IEEE Transactions on Nuclear Science, vol. 61, no. 6, pp. 3163–3170, 2014.
R. W. Blaine Jr, The design of single-event hardened analog and mixed-signal circuits. Vanderbilt University, 2014.

2013

P. Maillard, W. T. Holman, T. D. Loveless, and L. W. Massengill, “A new error correction circuit for delay locked loops,” IEEE Transactions on Nuclear Science, vol. 60, no. 6, pp. 4387–4393, 2013.
N. Mahatme et al., “Estimating the frequency threshold for logic soft errors,” in 2013 IEEE International Reliability Physics Symposium (IRPS), IEEE, 2013, pp. 3D – 3.
N. Mahatme et al., “Impact of supply voltage and frequency on the soft error rate of logic circuits,” IEEE Transactions on Nuclear Science, vol. 60, no. 6, pp. 4200–4206, 2013.
N. Mahatme et al., “Experimental estimation of the window of vulnerability for logic circuits,” IEEE Transactions on Nuclear Science, vol. 60, no. 4, pp. 2691–2696, 2013.
J. Maharrey et al., “Effect of device variants in 32 nm and 45 nm SOI on SET pulse distributions,” IEEE Transactions on Nuclear Science, vol. 60, no. 6, pp. 4399–4404, 2013.
T. Loveless et al., “On-chip measurement of single-event transients in a 45 nm silicon-on-insulator technology,” IEEE Transactions on Nuclear Science, vol. 59, no. 6, pp. 2748–2755, 2013.
K. Lilja et al., “Single-event performance and layout optimization of flip-flops in a 28-nm bulk technology,” IEEE Transactions on Nuclear Science, vol. 60, no. 4, pp. 2782–2788, 2013.
A. V. Kauppila et al., “Effect of negative bias temperature instability on the single event upset response of 40 nm flip-flops,” IEEE Transactions on Nuclear Science, vol. 59, no. 6, pp. 2651–2657, 2013.
S. Jagannathan et al., “Sensitivity of high-frequency RF circuits to total ionizing dose degradation,” IEEE Transactions on Nuclear Science, vol. 60, no. 6, pp. 4498–4504, 2013.
W. T. Holman, J. S. Kauppila, T. D. Loveless, L. W. Massengill, B. L. Bhuva, and A. F. Witulski, “Low-Penalty Radiation-Hardened-by-Design Concepts for High-Performance Analog, Mixed-Signal, and RF Circuits,” in Proceedings of the 2013 Government Microcircuit Applications & Critical Technology Conference (GOMACTech), 2013.
S. Jagannathan et al., “Frequency dependence of alpha-particle induced soft error rates of flip-flops in 40-nm CMOS technology,” IEEE Transactions on Nuclear Science, vol. 59, no. 6, pp. 2796–2802, 2013.